In recent years, the new materials industry, especially the nanomaterials industry, has been growing with the increasing scientific research on new materials technology and nanotechnology, which has placed new and higher demands on the metrology work in the related fields. Nanomaterials metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on Tencor P2 Long Scan Contact Profilometer.
Tencor P2 Long Scan Contact Profilometer
The Tencor Profiler is a metrology tool that generates a 2 dimensional profile of the surface of a sample. This is done by a stylus, which touches the surface of a sample and is scanned across a prescribed length. Step heights and widths of structure can be measured in this way. Measurement of vertical features ranging from under 100 Å (0.4 µin) to approximately 0.3 mm (11 mils), with a vertical resolution of 1 or 25 Å (0.004 or 0.1 µin)
Alfa Chemistry' Nanomaterials Analysis Laboratory can provide Tencor P2 Long Scan Contact Profilometer-based nanomaterials metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
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