In recent years, the new materials industry, especially the nanomaterials industry, has been growing with the increasing scientific research on new materials technology and nanotechnology, which has placed new and higher demands on the metrology work in the related fields. Nanomaterials metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on Photospectrometer, Filmetrics F40.
Photospectrometer, Filmetrics F40
The Filmetrics F40 is used to measure the thickness and optical constants (n&k) of dielectric and semiconductor thin films. Measured films must be optically smooth and within the range of 30A to 40 µm.Transmission-vs- wavelength can also be measured if substrate is transparent. Commonly measured films include nitrides, oxides, photoresists, polysilicon, polyimides, cell gaps, etc.
Alfa Chemistry' Nanomaterials Analysis Laboratory can provide Photospectrometer, Filmetrics F40-based nanomaterials metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
Please fill out the form below and we will get back to you as soon as possible with a quotation for the item you are interested in.
Alfa Chemistry provides customized laboratory services to research institutes, universities, and other institutions in the field of chemistry and materials. Our mission is to provide you with comprehensive and powerful technical support.
Privacy Policy | Cookie Policy | Copyright © 2025 Alfa Chemistry. All rights reserved.