In recent years, as scientists continue to research more and more into materials science, the new materials industry, especially the nanomaterials industry, has grown and developed, placing new and higher demands on metrology in related fields. Metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS) - Cryo-IONTOF M6 Special Edition.
Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS) - Cryo-IONTOF M6 Special Edition
1. Time-of-flight analyzer for mass resolution up to 30000, mass accuracy of a few ppm
2. Bismuth liquid metal ion gun (30 keV) for high resolution (< 70 nm) imaging
3. Argon gas cluster ion gun (5 to 20 keV) for analysis and molecular depth profiling
4. Dual beam ion gun (0.25 to 2 keV, Ar+, O2-, Cs+) for depth profiling
5. Cryogenic sample handling for analysis of hydrated samples
6. Programmable sample heating and cooling (-180 to 600℃)
7. High speed sample rotation stage for high resolution depth profiling
The Materials Analysis Laboratory at Alfa Chemistry can provide Time-of-Flight- Secondary Ion Mass Spectroscopy (TOF-SIMS) - Cryo-IONTOF M6 Special Edition-based metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
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