In recent years, as scientists continue to research more and more into materials science, the new materials industry, especially the nanomaterials industry, has grown and developed, placing new and higher demands on metrology in related fields. Metrology services are an area of expertise for Alfa Chemistry and we can provide our customers with solutions based on J. A. Woollam V VASE Spectroscopic Ellipsometer.
J.A. Woollam V VASE Spectroscopic Ellipsometer
It combines high accuracy and precision with a wide spectral range up to 300 to 1100 nm. Variable wavelength and angle of incidence allow flexible measurement capabilities including:
1. Reflection and Transmission Ellipsometry
2. Generalized Ellipsometry
3. Reflectance (R) intensity
4. Transmittance (T) intensity
5. Cross-polarized R/T
6. Depolarization
7. Scatterometry
8. Mueller-matrix
The VASE is one of the most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more.
The Materials Analysis Laboratory at Alfa Chemistry can provide J. A. Woollam V VASE Spectroscopic Ellipsometer-based metrology services to our clients. If you would like to receive details of this project, please contact us directly.
For research use only, not intended for any clinical use.
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