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Materials Characterization and Analysis Service—Zeiss Crossbeam 350 With Laser

Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on Zeiss Crossbeam 350 With Laser.

Name Of The Instrument/Platform

Zeiss Crossbeam 350 With Laser

MANUFACTURER: Zeiss

Introduction

The Crossbeam 350 is equipped with SE2 and InLens secondary electron detectors as well as an in-column energy-selective backscattered (ESB) detector and an retractable 4-quadrant annular backscattered electron detector. There are 2 IR Cameras to assist with navigation as well as one in the airlock. The airlock enables efficient sample transfer without the need to vent the specimen chamber.
The 30 kV Ga ion beam ranges from 1 pA to 100 nA, enabling both precise nano-scale patterning and fast material removal. The voltage can go as low as 500 V for gentle cleaning with minimal ion penetration depth.
Two gas-injection systems enable site-specific deposition of tungsten or carbon. A Kleindiek MM3 micromanipulator with rotation enables in-situ micromanipulation.
The stage has a large Z-range of up to 50 mm and tilt ranges from -4 to 70 degrees.
The electron imaging current spans 5pA to 100nA and the voltage from 0.02kV to 30kV.
Future add-ons to the Crossbeam 350 at CCEM include a Leica cryo system with cold vacuum transfer capability, Fibics scan generator with Atlas 5 software, correlation with 3D X-ray micro-CT data, and more.

Summary

The Crossbeam 350 at CCEM is fully-equipped to handle a wide variety of scenarios, highlighted by a femtosecond laser that enables massive volumes of material ablation in addition to all the full functionality of a FIB-SEM.
The femtosecond laser is attached to the airlock to avoid chamber contamination, yet the laser positioning is still registered to the SEM image to enable site-specific laser ablation of specimens at rates that are orders of magnitude greater than the removal rate of even a plasma-FIB. Access to the millimetre scale is routine work for this laser. The femtosecond laser ablates material so quickly that there is almost no significant damage or heat-affected zone. Additionally, the Crossbeam 350 at CCEM is the first Zeiss Laser FIB installation in the world with "Burst Mode", which further improves efficiency.

Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our Zeiss Crossbeam 350 With Laser-based materials analysis services, please contact us directly.

For research use only, not intended for any clinical use.

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