Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on Veeco's NT3300 Non-Contact Optical Profiler.
Veeco's NT3300 Non-Contact Optical Profiler
Measurement Modes Phase Shifting Interferometry (PSI) uses the interference of light to map the surface of a sample. PSI is used for extremely smooth samples like mirrors or optics. In PSI, a piezoelectric transducer (PZT) within the integrated optics assembly (IOA) head precisely shifts the interference pattern six times; each shift is captured to produce one frame of data. The frames are then reconstructed to form a topographical map of the measured surface. PSI is typically used to measure samples with Ra between 0.1–160 nm. Vertical Scanning Interferometry (VSI) also uses the interference of light to map the surface of a sample. VSI is used for relatively rough surfaces (Ra greater than 0.1 mm) or surfaces with discontinues, features, or steps greater than 160 nm (l/4) . In VSI, the optics physically scan through the focal points of the object while obtaining "snapshots", called frames, from the camera inside the IOA. The frames are then used to reconstruct a map of the sample's surface.
Measurements: Step Height § Surface Contour § Surface Roughness § Volume Analysis Features § 4 × 4 inch X,Y Travel § Field of View: 0.05–8.24 mm § Vertical RMS Repeatability: 0.01 nm § Angstrom Vertical Resolution (<1Ǻ Ra) § Lateral Spatial Sampling: 0.08 to 13.1 µm § Vertical Measurement Range: 0.1 nm to 2.0 mm § Stitching Capabilities for Analysis of Large Areas § 0.5 to 100× Magnification by Means of 3 Different Objectives
The NT3300 is ideally suited for quality inspection, failure analysis, and rapid production measurement of MEMS, semiconductor packaging, medical devices, automotive systems and many other applications.
Veeco's NT3300 Non-Contact Optical Profiler features advanced automation and outstanding software for highly accurate, 3D surface topography measurements. The most advanced surface metrology system available, the NT3300 rapidly measures heights from Angstroms to millimeters, with vertical resolution down to 0.1 nm.
Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our Veeco's NT3300 Non-Contact Optical Profiler-based materials analysis services, please contact us directly.
For research use only, not intended for any clinical use.
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