Alfa Chemistry' materials analysis laboratories are equipped with world-class materials analysis instruments to provide comprehensive materials analysis services for high-tech companies in materials chemistry, metallurgy and minerals, electrical and electronics, biomedicine, semiconductor, and superconductivity, and nanotechnology to meet their requirements for morphological observation, trace surface analysis, materials composition analysis, and microstructure analysis at sub-micron resolution. We provide you with material analysis solutions based on Cameca IMS-3F SIMS Ion Microsope.
Cameca IMS-3F SIMS Ion Microsope
SIMS (Secondary Ion Mass Spectrometry) is an analytical technique that is used to characterize the surface and near surface (~30mkm) region of materials. It is capable of detecting practically all elements, including hydrogen (only the noble gases are difficult to measure) with detection limits in ppm range for most elements and ppb range for some. There are several modes of SIMS instrument operation:
1. Static SIMS - allows molecular as well as elemental characterization of the first top monolayer.
2. Dynamic SIMS - provides for the investigation of bulk composition or the depth distribution of the trace elements.
3. Ion imaging - allows lateral imaging and, if combined with depth profiling, -3D compositional reconstruction for heterogeneous samples.
4. Isotope ratio measurement - another unique technique of SIMS making it possible to measure isotope ratio with precision of 0.1% and better.
SIMS can be applied to any type of material (insulators, semiconductors, metals, and organic molecules) that can stay under vacuum.
1. Depth resolution: ~5 nm
2. Lateral resolution: ~1mkm
3. Mass resolution (M/delta M) : from 200 to more than 10000
4. Mass range: 0-250 amu
5. Primary ions: O2+, O-, Ar+, Xe+, Cs+ from 5 to 15kV
6. Maximum sample size: 1×1×1 cm
7. Mass analyzer type: magnetic sector
Alfa Chemistry, a leader in materials analysis, is committed to providing you with tailor-made analytical service solutions. If you are interested in our Cameca IMS-3F SIMS Ion Microsope-based materials analysis services, please contact us directly.
For research use only, not intended for any clinical use.
Please fill out the form below and we will get back to you as soon as possible with a quotation for the item you are interested in.
Alfa Chemistry provides customized laboratory services to research institutes, universities, and other institutions in the field of chemistry and materials. Our mission is to provide you with comprehensive and powerful technical support.
Privacy Policy | Cookie Policy | Copyright © 2025 Alfa Chemistry. All rights reserved.