Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. Alfa Chemistry can provide innovative solutions for electron microscopy and microanalysis. We offer JEOL JSF-7000F Field Emission SEM instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.
JEOL JSF-7000F Field Emission SEM
MANUFACTURER: JEOL
The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source and state-of-the-art computer technology for the image-display system. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis.
1. Schottky Field Emission Cathode
2. High Resolution (1.2 nm @30kV)
3. Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
4. EDAX "Octane Pro" SDD EDS
5. EDAX "Hikari Pro" 600pps EBSD detector
6. Electron Lithography
Alfa Chemistry provides JEOL JSF-7000F Field Emission SEM-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.
For research use only, not intended for any clinical use.
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Alfa Chemistry provides customized laboratory services to research institutes, universities, and other institutions in the field of chemistry and materials. Our mission is to provide you with comprehensive and powerful technical support.
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