Electron Microscope Imaging Service—Hitachi S-4700 FE-SEM

1. Secondary imaging can be carried out at short working distances with an overhead detector or at longer distances with a side-mounted detector, and these SE detector signals can be isolated or mixed.
2. Backscatter imaging can be accomplished at accelerating voltages as low as 1 kV at high resolution with the Hitachi-proprietary ExB detector.
3. The menu based Windows software and greater automation will lead to greater ease of use for most individuals.
4. Energy dispersive analysis is provided via an ultra thin window detector.
5. Analysis of elements from boron through uranium is possible with this detection system.
6. It is interfaced with a Gresham Titan Analog HV Power Supply / Pulse Processor and 4Pi Spectral Engine Hardware with DTSA and Revolution Software.
7. Software is available in these packages for X-ray mapping, qualitative, standardless and rigorous standards-based quantitative analysis.
8. The S-4700 FE-SEM system is interfaced to the campus network so all user data can be downloaded to user storage systems from the laboratory.