Electron microscopes can excite electrons to form images that magnify micron and nanostructures up to 10 million times, providing amazing levels of fine magnification and allowing researchers to observe even individual atoms. Alfa Chemistry can provide innovative solutions for electron microscopy and microanalysis. We offer FEI 200kV Titan Themis STEM instruments that allow customers to combine high-resolution imaging with physical, elemental, chemical and electrical analysis to obtain usable data from the widest range of samples.
FEI 200kV Titan Themis STEM
MANUFACTURER: FEI
Ex situ and In situ Capabilities
Conventional TEM (CTEM)
Accelerating Voltages from 80–200 kV
1. High Contrast images (desired for standard biological TEM samples) at Low Magnification mode (field of view from 100 microns to 1 micron)
2. High Resolution TEM (HRTEM) to identify lattice spacings less than 0.15 nm
3. Crystallographic phase analysis in Diffraction mode:
1) Selected Area Electron Diffraction (SAD) from a minimum area of 200 nm in diameter
2) Convergent-beam Electron Diffraction (CBED) analysis: e.g. determination of crystal system, Bravais lattice, point, and space groups of crystals larger than 50 nm in size
3) Nanobeam Electron Diffraction (NBD) analysis (Convergent semi-angle less than 0.1 mrad)
Probe Corrected Scanning Transmission Electron Microscopy (STEM)
Accelerating Voltages from 80–200 kV
1. Z-contrast images by High-angle Annular Dark-Field (HAADF) (Fischione HAADF detector)
2. Atomic resolution Z-contrast imaging by HAADF-STEM
3. Annular Dark-Field (ADF), low angle ADF, and Bright-Field STEM imaging (useful for grain size, dislocations and defect imaging)
4. Micro-probe STEM with larger depth of focus
ChemiSTEM Super X-ray Energy Dispersive Spectroscopy
Four X-ray Detectors, FEI/ThermoFisher
1. Fast elemental analysis and elemental mapping up to very high spatial resolution (combined with HAADF-STEM)
2. Clear and low background XEDS spectrum using the beryllium specimen holder.
3. 3-dimension elemental analysis reconstruction (STEM EDS Tomography)
Electron Energy Loss Spectroscopy (EELS)
GIF Quantum Dual EELS System
1. Elemental analysis from Li–U at very high spatial resolution (combined with HAADF-STEM)
2. Elemental mapping and phase mapping by STEM-EELS spectrum imaging
3. Low-loss and core-loss EELS with energy resolution of 0.9 eV
4. Oxidation state analysis by core-loss EELS
5. Thickness measurement
Energy Filtered TEM (EFTEM)
GIF Quantum Dual EELS System
1. Elastic electron imaging to enhanced contrast of TEM images and diffraction patterns
2. Thickness and elemental mapping (in EFTEM mode) and EFTEM spectrum imaging
Ex situ TEM Sample Holders
1. Single Tilt holder (FEI/ThermoFisher)
2. Beryllium tip Double Tilt holder (FEI/ThermoFisher)
3. Room temperature tomography holder (Fischione) for both TEM and STEM tomography
In situ TEM Sample Holders
1. Electrical bias and Heating stage NanoEx holder (FEI/ThermoFisher)
2. Nanoindentation holder (Nanofactory)
3. Poseidon 510 liquid cell holder (Protochip)
The Themis has a full complement of state-of-the-art accessories, including six specialized specimen holders that extend the STEM utility.
Alfa Chemistry provides FEI 200kV Titan Themis STEM-based electron microscopy imaging services to our clients. If you are interested, please feel free to contact us.
For research use only, not intended for any clinical use.
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