Atomic Force Microscopy (AFM) is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It investigates the surface structure and properties of materials by detecting the very weak interatomic interaction forces between the surface of the sample to be measured and a miniature force-sensitive element. Alfa Chemistry provides Veeco Dimension 3100 AFM-based AFM imaging services.
Veeco Dimension 3100 AFM
The Veeco Dimension 3100 AFM is capable of contact and tapping mode as well as force curve measurements. It can be used with a variety of probes, depending on the application. Its motorized stage allows the investigation of large sample and the enclosure provides thermal and vibration insulation for high-resolution measurements.
If you need atomic force imaging analysis of materials, please contact us directly for assistance.
For research use only, not intended for any clinical use.
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