Atomic Force Microscopy (AFM) is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It investigates the surface structure and properties of materials by detecting the very weak interatomic interaction forces between the surface of the sample to be measured and a miniature force-sensitive element. Alfa Chemistry provides NT-MDT Ntegra Solaris Atomic Force Microscope (AFM)-based AFM imaging services.
NT-MDT Ntegra Solaris Atomic Force Microscope (AFM)
The Atomic Force Microscope (AFM) is primarily used to measure and analyse surface topography and morphology, providing nanoscale height measurements.
The AFM is used for relatively small and flat samples - the maximum scan area is 100 × 100 microns and it can scan features up to 10 microns in height. Data collected provides information on the height of surface features, which allows both 2D and 3D imaging of a sample surface.
There is limited sample preparation involved and samples can be imaged in air. The two main modes used are contact and semi-contact modes.
Examples of applications include the analysis of optical fibres, graphene, nanoparticles and nanotubes.
If you need atomic force imaging analysis of materials, please contact us directly for assistance.
For research use only, not intended for any clinical use.
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