Atomic Force Microscopy (AFM) is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It investigates the surface structure and properties of materials by detecting the very weak interatomic interaction forces between the surface of the sample to be measured and a miniature force-sensitive element. Alfa Chemistry provides JEOL JSPM 5400 MkII Environmental Atomic Force Microscope-based AFM imaging services.
JEOL JSPM 5400 MkII Environmental Atomic Force Microscope
MANUFACTURER: JEOL
JEOL JSPM 5400 MkII is an environmental Scanning Probe Microscope which is configured for observation and nano-characterisation of inorganic and device materials. The JEOL JSPM 5400 MkII eAFM has a number of piezo-scanners and a range of atomic force imaging modes which may be operated in ambient and high vacuum conditions (~10-6Pa) enabling control of environmental conditions (pressure and temperature) during imaging. Some examples of the imaging modes available include contact, intermittent contact and non-contact topography imaging. The eAFM 5400 is able to measure features up to ~10 µm in height, dependent on the choice of piezo-scanner.
If you need atomic force imaging analysis of materials, please contact us directly for assistance.
For research use only, not intended for any clinical use.
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